Robustness of CMOS Technology and Circuitry Outside the Imaging Core : Integrity, Variability, Reliability

Albert Theuwissen announces the 4th Harvest Imaging Forum "Robustness of CMOS Technology and Circuitry outside the Imaging Core : integrity, variability, reliability" by Harry Veendrick. The forum is to be held in December, 2016 in Voorburg (the Hague), the Netherlands. The 2016 Forum is meant to present an overview on the importance of understanding all aspects that determine the robustness of CMOS integrated circuits present “around” the imaging core of a CMOS image sensor.