Billion-pixel-resolution microscopy of curved surfaces

Recent Optical news article covers a publication by Yang et al. which presents a new technique for capturing high resolution microscopy images of curved surfaces. 

X. Yang, H. Chen, L. Kreiss, C.B. Cook, G. Kuczewski, M. Harfouche, M.O. Bohlen, R. Horstmeyer, “Curvature-adaptive gigapixel microscopy at submicron resolution and centimeter scale,” Opt. Lett., 50, 5977-5980 (2025).
DOI: 10.1364/OL.572466

New microscope captures large, high-resolution images of curved samples in single snapshot
Innovation promises faster insights for biology, medicine and industrial applications

Researchers have developed a new type of microscope that can acquire extremely large, high-resolution pictures of non-flat objects in a single snapshot. This innovation could speed up research and medical diagnostics or be useful in quality inspection applications.

“Although traditional microscopes assume the sample is perfectly flat, real-life samples such as tissue sections, plant samples or flexible materials may be curved, tilted or uneven,” said research team leader Roarke Horstmeyer from Duke University. “With our approach, it’s possible to adjust the focus across the sample, so that everything remains in focus even if the sample surface isn’t flat, while avoiding slow scanning or expensive special lenses.”

In the Optica Publishing Group journal Optics Letters, the researchers show that the microscope, which they call PANORAMA, can capture submicron details — 1/60 to 1/120 the diameter of a human hair — across an area roughly the size of a U.S. dime without moving the sample. It produces a detailed gigapixel-scale image, which has 10 to 50 times more pixels than the average smartphone camera image.

“This tool can be used wherever large-area, detailed imaging is needed. For instance, in medical pathology, it could scan entire tissue slides, such as those from a biopsy, at cellular resolution almost instantly,” said Haitao Chen, a doctoral student in Horstmeyer’s lab. “In materials science or industrial inspection, it could quickly inspect large surfaces such as a chip wafer at high detail.”




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