Dark Current and Plasma DamageMDPI paper "CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current" by Yolène Sacchettini, Jean-Pierre C…Read More...
Micro-power ToF CameraIEEE Sensors Journal publishes EPFL open-access paper "An Ultra-Low Power PPG and mm-Resolution ToF PPD-Based CMOS Chip Towards All-in-One P…Read More...
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